PC-DMIS Go: Delivering Actionable Metrology to Your Mobile Smartphoneby Ken Woodbine on June 11, 2018 From Technology
The primary objective of metrology software is to create actionable information. As a metrology software development team, we are constantly seeking to add value to this task by delivering metrology information in ways that benefit our customers. During HxGN LIVE 2018, we’re previewing a new tool for doing just that with our PC-DMIS Users’ Group attendees – PC-DMIS Go.
PC-DMIS Go is a mobile application that will be available to smartphone users running iOS or Android systems. With PC-DMIS Go, we add mobile notifications as the newest method for delivering relevant, timely data to users at all levels of your business. Whether you are a CMM programmer, a quality engineer, a manufacturing engineer, or a plant manager, there are value-driven notifications you can subscribe to. This ensures that you have up to the second information on critical functions like machine status, measurement routine progress, immediate results data, and calls to action.
Once launched, the PC-DMIS Go app will be available to download from your regular app store. A separate Notifications Center program will also be loaded in your manufacturing facility. PC-DMIS Go will work on a subscription basis, with a free basic subscription included for users with a valid software maintenance agreement (SMA) and a premium level option that opens up more advanced notifications. Once registered, PC-DMIS Go will allow users to select from all the devices and measurement routines at their facility and identify which messages they are interested in receiving.
We’re really excited to show this new application to our PC-DMIS Users’ Group and hear their feedback as we finalise the development of PC-DMIS Go prior to commercial release. Hope you can join us at HxGN LIVE!
Ken Woodbine leads the Metrology Software Product Line at Hexagon Manufacturing Intelligence, having joined the company in 2001. He holds a Bachelor's degree in Computer Science. He previously held senior positions at Brown and Sharpe and has over 27 years’ experience in the metrology industry.