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Europe
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Compact White Light Measurement System
Flashes occur everywhere: The Hexagon Manufacturing Intelligence WLS qFLASH is a non-contact multi-talent which rapidly carries out 3D measurements, creates reports and digitizes right on the spot. Lightweight, easy to handle and robust. It is designed for use on a tripod and in handheld mode, for ultra-portable measurements on the part or direct root cause analysis.
WLS qFLASH is an affordable solution for:
WLS qFLASH is an affordable solution for:
- Automotive suppliers
- Aerospace suppliers and OEMs
- Plastic part manufacturers
- Electronic part manufacturers
- Sheet metal part measurement
- Inspection of closures
- Measurement of aluminium and metal casting
- Inspection of plastic parts, interiors and small moulds
As quick and bright as a FLASH.
Leading-edge technology for shop floor conditions: The Hexagon Manufacturing Intelligence WLS qFLASH is immune to industrial light, machinery vibrations and temperature changes. It can be operated on a pedestal or in handheld mode. The WLS qFLASH is a smart and powerful top performer, even for restrained budgets.
Leading-edge technology for shop floor conditions: The Hexagon Manufacturing Intelligence WLS qFLASH is immune to industrial light, machinery vibrations and temperature changes. It can be operated on a pedestal or in handheld mode. The WLS qFLASH is a smart and powerful top performer, even for restrained budgets.
- Powerful PC platform for fast analysis and reporting
- Compact power supply for full mobility
- Flexible pedestal or handheld operation
- 350 x 350 mm field of view for shorter working distance and more convenient measurement of small parts
- CoreView software: Hexagon Manufacturing Intelligence's intuitive dedicated White Light measurement and analysis suite
- System fits into a single box and can be carried by one person
- Rock solid carbon fibre optical housing
- 3 digital cameras to ensure best 3D data results
- Advanced Blue LED technology for reliable results
Hexagon Manufacturing Intelligence WLS
qFLASH Technical Specifications
| Cameras | 3 x 4.2 Megapixel digital cameras designed for industrial applications. Protected by rigid and temperature stable carbon fibre housing. |
| Projection & 3D Reconstruction Technology | Random Pattern Projection and Rapid Shot Stereo Vision Technology. Integrated 2D & 3D technology for fast and accurate surface and feature measurement. |
| Illumination | Blue LED based high power illumination. Reliable and durable. |
| FOV Specifications | Field of view (at a specified working distance): 350 X 350 mm Depth of Field: 160 mm Optimal Working Distance: 550 mm Point Cloud Spacing: From 0.19 mm |
| Metrology Performance | |
| VDI / VDE 2634 Part 2 | System MPE according to VDI / VDE 2634 Part 2 (350 X 350 mm FOV lens, RE mode); Industry Applications Probing Error: 0.040 mm Spacing Error: 0.035 mm Flatness Error: 0.035 mm |
| Industrial Performance | Numbers stated in 2 sigma, LFOV, avg to avg. (WLS qFLASH-CMM), external mapping is used Plane measurement accuracy (Single tile): 0.035 mm WLS qFLASH Point cloud accuracy (3 x 2 x 1 m size object): 0.1 mm |
| Operation Performance | Average Optical Exposure Time (Typical settings): 20 msec |
| Dimensions & Weights | WLS qFLASH Sensor 370 X 270 X 255 mm, 6.0 kg WLS qFLASH Power Supply 310 X 215 X 60mm, 3 kg |
| Electrical compatibility | Voltage: 90-230 VAC 50-60 Hz Power: 0.7 kW - at peak consumption |
| Working environment conditions | Operating temperature: 5 - 35°C (Limited by PC/Laptop specification. Can be enhanced with cooling systems.) Operating lighting conditions: Low sensitivity to industrial lighting, ambient light sources and non direct daylight. Structure/facility vibrations: Designed for operation in industrial environments. |
| Periodic system certification | On site yearly calibration and certification to traceable artefacts |
| Computer & Software | Operating System: Windows 7 64Bit OS Computing platform: Laptop System Software: CoreView™ by Hexagon Metrology |
| Certifications & standards | CE / TÜV -Safety: IEC\EN 61010-1:2001 EMC: IEC\EN 61000 VDI/VDE 2634 Part 2 standard for optical measurement systems. Traceability to NIST metrology standard artefacts ISO 9001:2000 |
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