Scan hard to see geometries with the HP-C-VE CMM Sensor

by Andrew Scarella on August 31, 2016 From Technology, News And Comment
HP-C-VE-M

"Getting the Whole 'Metrology' Picture"

Do you find that some of your components have hard to reach, and therefore hard to see, geometries? With the HP-C-VE, you can have the visibility and flexibility of a vision system on your GLOBAL CMM. The HP-C-VE is a sensor designed to be a general purpose image analysis tool for enhancing the capabilities of a CMM by providing oblique overhead illumination of the feature being inspected. Combined with the automatic probe change, you can enhance your CMM’s capability even further by allowing sensor exchanging without the need for any operator intervention, saving you valuable time.

To learn more about this CMM Vision sensor, visit the HP-V-CE product page.

Andrew Scarella

Andrew Scarella is the Digital Marketing Manager for Hexagon Manufacturing Intelligence North America. He contributes to this blog as well as updates the North American website and provides content for the company social media channels including Facebook, Twitter and LinkedIn.