Chromatic white light sensor (CWS)

Chromatic white light sensor (CWS)

Cws_Application-M
The chromatic white light sensor (CWS) is a highly efficient scanning sensor. It is based on the confocal measurement principle and works using chromatic depth scanning. This technique uses a special lens that refracts white light differentially depending on its wavelength in order to carry out distance measurements. The system resolution therefore depends on the intensity of the light reflected from the surface of the inspected part.

The CWS achieves very high measuring dynamics with highly reflective objects, e.g. mirrors, glass etc. and with light-absorbing objects, e.g. matt black surfaces.

The CWS is especially suitable for digitising all types of freeform surfaces. It can also be used for measuring the thickness of glass or lenses and for capturing the topology of microstructures.

The CWS achieves a vertical resolution of up to 10 nm and a scanning rate of up to 1000 points per second.

The chromatic white light sensor is the ideal choice:
  • For the topographical acquisition of microstructures
  • For the digitisation of glossy surfaces (e.g. glass, polished metal)
  • For the digitisation of transparent materials
Example applications for CWS:
  • Microlenses
  • Ball grid arrays (BGA)
  • Integrated circuits
  • Medical implants
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  • Very robust measurements using the confocal measuring principle
  • Measuring range from 300 µm to 10 mm
  • Working distance from 4.5 mm to 75 mm
  • Resolution up to 10 nm
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Case Study Hitega Praezisionsmechanik

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